By Dana Crowe, Alec Feinberg
This ebook is easily a robust addition to the physique of information for Reliability execs and for any corporation that wishes to enhance the company competitiveness via enhancing the product reliability.
The ebook essentially offers the right kind concentrate on the client, however it additionally elaborates at the indisputable fact that one buyer is the company corporation.
The e-book indicates the optimal series of DfR actions within the improvement stages. This publication additionally has striking information for the explicit DfR components. it's also a good source for counsel into particular info.
I just like the stability of pics with textual content and the photographs extra first-class extra understanding.
This is an exceptional chief that has documented the applied perform during this book.
I didn't try to ensure each mathematical formulation.
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Extra info for Design for Reliability
It can be challenging to design fixtures that survive high-temperature reliability experiments and still provide a stable biasing environment for the test vehicle. This challenge increases for high-frequency, high-gain, and submicron gate-length GaAs FET applications. These devices are extremely susceptible to bias oscillations. Component availability may also lead to problems in obtaining sufficient quantities for performing statistically valid life tests based on discrete elements. This is typically a problem when components are not manufactured as products.
Coef. 60 Fit Reg. Coef.
Test Hot/Cold/R Temperature Cycle For Solder Joint Studies, Should Come from HTOL-Tested Devices B12 C B4 Pretest Bake B8 B13 Temp-Humidity-Bias RT Measurements at 0, 48, 168, 500, 1000 Hrs. B5 B14 B15 Application-Specific Testing Block 2. This step can be combined with Block 3 for process capability (Cpk) analysis. The purpose of process capability analysis in Blocks 3 and 9 is to verify that all key electrical parameters remain within the process capability indices limits over both their specified temperature ranges and over accelerated-life-test conditions.